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25-58269
Cryo-Focused Ion Beam (FIB) and scanning electron microscope (SEM)
National Research Council of Canada (NRC) · Ottawa, Ontario, Canada
This tender closed on Tuesday, February 24, 2026. Browse open opportunities
Time Left to Bid
Closed
ClosedOffice Supplies & EquipmentFederal
Basic information
- Reference number
- 25-58269
- Issuing organization
- National Research Council of Canada (NRC) · Find award history →
- Government level
- Federal
- Solicitation type
- Office Supplies & Equipment
- Title
- Cryo-Focused Ion Beam (FIB) and scanning electron microscope (SEM)
- Source
- CanadaBuys
- Source ID
- 25-58269
Details
- Location
- Ottawa, Ontario, Canada
Description
The objective of this procurement is to install Cryo-Focused Ion Beam and scanning electron microscope (Cryo FIB/SEM) for high volume etching capability in the Development and Analytical Microscopy team of the NRC Quantum Nanotechnology Research Centre. This new Cryo FIB/SEM will replace our aging microscope and be part of the QN microscopy suite of equipment.
Dates
- Publication
- 2026/01/29 12:00:00 AM UTC
- Closing date
- 2026/02/24 02:00:00 PM UTC
Documents
Classification
UNSPSC categories
41100000
Normalized category
Office Supplies & Equipment