1333ND26PNB030039

Focused Ion Beam/Scanning Electron Microscope (FIB/SEM)

COMMERCE, DEPARTMENT OF.NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY.DEPT OF COMMERCE NIST · MD, United States

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Awarded

AwardedOffice Supplies & EquipmentFederal

Basic information

Reference number: 1333ND26PNB030039
Issuing organization: COMMERCE, DEPARTMENT OF.NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY.DEPT OF COMMERCE NIST · Find award history →
Government level: Federal
Solicitation type: Office Supplies & Equipment
Title: Focused Ion Beam/Scanning Electron Microscope (FIB/SEM)
Source: SAM.gov
Source ID: dd96e5e5b43342f2a8c8899af4e24d7b

Details

Location: MD, United States

Summary

Procurement of a sophisticated Focused Ion Beam/Scanning Electron Microscope (FIB/SEM) for advanced scientific research and materials analysis. The equipment will enable high-resolution imaging and precise material characterization.

Description

https://api.sam.gov/prod/opportunities/v1/noticedesc?noticeid=dd96e5e5b43342f2a8c8899af4e24d7b

microscopy scientific equipment electron microscope materials science research instrumentation

Dates

Publication: 2026/04/06 12:00:00 AM UTC
Closing date: N/A

Estimated value

$500K – $1.5M USD

Classification

NAICS codes

NAICS 334516

Normalized category

Office Supplies & Equipment

Source: SAM.gov

Last updated 2026-05-03, 1:06:06 p.m.

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