1333ND26PNB030039

OU03-FY26-194-NEW FOCUSED ION BEAM/SCANNING ELECTRON MICROSCOPE (FIB/SEM) WITH 5 YEARS SERVICE/MAINTENANCE.

National Institute of Standards and Technology · United States

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Awarded

AwardedOtherFederal

Basic information

Reference number: 1333ND26PNB030039
Issuing organization: National Institute of Standards and Technology · Find award history →
Government level: Federal
Solicitation type: Other
Title: OU03-FY26-194-NEW FOCUSED ION BEAM/SCANNING ELECTRON MICROSCOPE (FIB/SEM) WITH 5 YEARS SERVICE/MAINTENANCE.
Source: USASpending (Federal)
Source ID: usa-1333ND26PNB030039

Details

Location: United States

Description

OU03-FY26-194-NEW FOCUSED ION BEAM/SCANNING ELECTRON MICROSCOPE (FIB/SEM) WITH 5 YEARS SERVICE/MAINTENANCE. Awarded to: FEI COMPANY Agency: Department of Commerce Sub-agency: National Institute of Standards and Technology Award type: PURCHASE ORDER

Dates

Publication: 2026/03/27 12:00:00 AM UTC
Closing date: 2027/03/26 12:00:00 AM UTC

Estimated value

$4.5M USD

Classification

Normalized category

Other

Source: USASpending (Federal)

Last updated 2026-05-25, 2:28:01 p.m.

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