Dynamic Secondary Ion Mass Spectroscopy Characterization System
National Research Council of Canada (NRC) · Ottawa, Ontario, Canada
Time Left to Bid
Closed
Basic information
- Reference number
- 25-58294
- Issuing organization
- National Research Council of Canada (NRC) · Find award history →
- Government level
- Federal
- Solicitation type
- Office Supplies & Equipment
- Title
- Dynamic Secondary Ion Mass Spectroscopy Characterization System
- Source
- CanadaBuys
- Source ID
- 25-58294
Details
- Location
- Ottawa, Ontario, Canada
Summary
Procurement of a specialized scientific instrument for Dynamic Secondary Ion Mass Spectroscopy (SIMS), used for detailed surface and material analysis in research or industrial settings.
Description
The objective of this solicitation is to select a supplier to manufacture, deliver, install, and commission a state-of-the-art Dynamic Secondary Ion Mass Spectrometry (SIMS) system. The proposed system must meet rigorous performance standards regarding sensitivity, depth resolution, and sample throughput. It must be capable of characterizing a comprehensive suite of semiconductor materials, including Group IV, III/V, III/Nitride, and II-VI compounds, and a wide range of elements. Additionally, t...
Dates
- Publication
- 2026/02/12 12:00:00 AM UTC
- Closing date
- 2026/03/10 02:00:00 PM UTC
Documents
Classification
UNSPSC categories
Normalized category