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1333ND26FNB770057
Combined and Hybrid Metrology for Microelectronics Manufacturing
Department of Commerce · MD, United States
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Awarded
AwardedOtherFederal
Basic information
- Reference number
- 1333ND26FNB770057
- Issuing organization
- Department of Commerce · Find award history →
- Government level
- Federal
- Solicitation type
- Other
- Title
- Combined and Hybrid Metrology for Microelectronics Manufacturing
- Source
- usaspending
- Source ID
- CONT_AWD_1333ND26FNB770057_1341_1333ND21DNB770022_1341
Details
- Location
- MD, United States
Summary
A scientific research initiative focused on developing innovative metrology approaches for future microelectronics manufacturing processes. The project aims to enhance measurement and analysis techniques for advanced semiconductor and microchip production.
Description
EMPOWERING COMBINED AND HYBRID METROLOGY FOR FUTURE MICROELECTRONICS MANUFACTURING FORECAST OU77-FY26-028-NEW Awarded to: PROMETHEUS COMPUTING, LLC Sub-agency: National Institute of Standards and Technology Contract type: DELIVERY ORDER
Dates
- Publication
- 2026/09/30 12:00:00 AM UTC
- Closing date
- 2027/09/29 12:00:00 AM UTC
Estimated value
$197K USD
Classification
Normalized category
Other