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1333ND23PNB680357
FOCUSED ION BEAM AND SCANNING ELECTRON MICROSCOPE
National Institute of Standards and Technology · United States
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Time Left to Bid
Awarded
AwardedOtherFederal
Basic information
- Reference number
- 1333ND23PNB680357
- Issuing organization
- National Institute of Standards and Technology · Find award history →
- Government level
- Federal
- Solicitation type
- Other
- Title
- FOCUSED ION BEAM AND SCANNING ELECTRON MICROSCOPE
- Source
- USASpending (Federal)
- Source ID
- usa-1333ND23PNB680357
Details
- Location
- United States
Description
FOCUSED ION BEAM AND SCANNING ELECTRON MICROSCOPE Awarded to: FEI COMPANY Agency: Department of Commerce Sub-agency: National Institute of Standards and Technology Award type: PURCHASE ORDER
Dates
- Publication
- 2023/09/21 12:00:00 AM UTC
- Closing date
- 2027/03/31 12:00:00 AM UTC
Estimated value
$3.9M USD
Classification
Normalized category
Other